"SynTest Granted Two More DFT Patents"SAN JOSE, CA--(Marketwire - Aug 8, 2012) - On April 17, 2012, the U.S. Patent and Trademark Office (USPTO) issued an important patent (U.S. Patent No. 8,161,441) to StarDFX Technologies, Inc., a leading supplier of Design-for-Excellence (DFX) IP and tools, and an affiliate of SynTest Technologies, Inc., for its groundbreaking invention covering a method for performing robust scan synthesis for soft-error protection to generate robust scan integrated circuit designs and systems. RobustScan™ Tool Suite from StarDFX uses the patented Robust Scan Cells.
Then, on July 10 and 24, 2012, the U.S. Patent and Trademark Office (USPTO) issued more DFT related patents (U.S. Patent No. 8,219,945 and 8,230,282) to SynTest. SynTest now has a very broad portfolio of DFT patents in the Scan Compression and Logic BIST areas, notably U.S. Patent Nos. 7,412,637, 7,412,672, 7,552,373, 7,721,172, and 7,590,905 (for conventional scan compression), 7,512,851 (for low-pin-count scan compression), 7,945,833 (for pipelined scan compression), and 7,007,213, 7,260,756, and 7,779,323 (for logic BIST).
"To date, StarDFX and SynTest have been issued 37 US patents, and I am particularly excited about StarDFX's proprietary robust scan technology covered by this patent because it opens up a new important field in Design-for-Reliability (DFR) for the semiconductor industry and for StarDFX," said Dr. L.-T. Wang, Founder, President and CEO of StarDFX and SynTest. "The patented robust scan cells, referred to as Configurable Soft-Error Resilience (CSER) cells, combined with user-preferred Soft-Error-Rate (SER) mitigation cells and the associated RobustScan™ product from StarDFX can be linked to third-party scan synthesis and SER analysis programs and are fully compatible with SynTest's DFT products for test, debug, and diagnosis."
"Effective soft-error protection mechanisms are not just needed for technology nodes below 65 nm, users of enterprise servers and networking hardware readily demand limits on SER. StarDFX and SynTest customers in the automotive, aerospace, medical, and networking industry will now benefit from the availability of the soft-error protection framework offered by RobustScan™," added Dr. Ravi Apte, VP of Strategy, Marketing and Business Development of SynTest.
"Effective protection mechanisms are not just needed for technology nodes below 65 nm, users of enterprise servers and networking hardware demand limits on SER. SynTest customers in the automotive, aerospace, healthcare, and networking area will now benefit from the availability of the soft-error protection framework offered by RobustScan." added Ravi Apte, Vice President of Marketing at SynTest.
SynTest Technologies Inc.