SynTest Announces DFT-PRO 100/200 Series
ATPG Starter Packages Improve Quality of ASICs;
and Offer Accessibility and Affordability
in Today's Changing ASIC Design Environment
SUNNYVALE, California, October 15, 2004 . Design-for-test (DFT)
leader SynTest Technologies today announced that it is now offering DFT-PRO
100 and 200 Series of ATPG starter packages that will include the essential
DFT tools for comprehensive ASIC testing. These tools will be able to
operate on scan-inserted netlists and will include tools for testing DFT
rules¯ violations, automatic test pattern generation (ATPG), as well
as test pattern formatting to directly link to ATE from popular vendors
such as Advantest, Agilent, Credence and Teradyne.
Experience has shown that to ensure a high quality of complex ASICs with
respect to manufacturing faults and to shorten test development time,
DFT methodology must be employed into ASIC designs.
Today, to curb costs, more and more large and small semiconductor companies
are shifting the DFT insertion responsibility from dedicated DFT engineers
to ASIC design engineers. Further, they are also increasingly out-sourcing
the design activity to independent ASIC design houses. In case of ASIC
design engineers, more than one engineer now needs to access the DFT tools
at the same time. In case of ASIC design houses, usually strapped for
cash, they now have to handle multiple projects simultaneously. In either
case, the engineers cannot wait for tool licenses to become available.
Consequently, they are all looking for unhindered accessibility to DFT
tools for multiple users, and needless to say, with easy affordability.
"To facilitate inclusion of DFT at the design stage itself, without having
to unduly burden financial resources, we are now offering the DFT-PRO
100 series of DFT tool packages," remarked L.-T. Wang, President and CEO
of SynTest Technologies. He added, "With the affordable cost of these
starter tool packages, our customers would be in a great position to recover
their investment in the tools in a very short time, in many cases with
their first design."
"Currently, we are offering two versions of the DFT-PRO 100 series. The
DFT-PRO 100 is a basic package, while the DFT-PRO 200 is a package for
chips with higher performance and shrinking geometries," said Ravi Apte,
VP of Strategy and Business Development at SynTest. "We do not want availability
of the DFT tools to become a bottle-neck for these design engineers or
design houses, and are hence offering multiple license options at affordable
prices. We expect this affordable pricing would also help designers of
IPs to verify their fault coverage at the design stage itself."
About the DFT-PRO 100/200 Series
The DFT-PRO 100 package contains the following tools:
1. TurboCheck-Gate - for DFT testability analysis at gate-level.
- Immediate feedback about potential design and testability problems
- Early detection of testability and synthesis constraint rule violations
2. TurboScan -ATPG - for automatic test pattern generation
for stuck-at, n-detect (multiple-detect), and Iddq fault models. It offers:
- Advanced multiple clock domain handling using SynTest¯s proprietary
- Scan extraction of pre-synthesized scan chains. Hence, it can be used
with scan chains inserted using third-party tools.
- Very compact ATPG patterns, especially for multi-clock designs
- Very high fault coverage using combinational ATPG
- Can be used for distributed ATPG to shorten elapsed time- Generation
of test vector sets for industry standard outputs such as STIL, Verilog,
VHDL, or WGL
3. TesterOut - formatter to output test vector sets in formats
that directly link to ATE from Advantest, Agilent, Credence, and Teradyne.
The DFT-PRO 200 package is the basic DFT-PRO 100 package with additional
support for transition and bridging fault models.
Packages and US Pricing
DFT-PRO 100 Series
DFT-PRO 101: 1 license for 3 years - $20K*
DFT-PRO 103: 3 licenses for 3 years - $30K*
DFT-PRO 110: 10 licenses for 3 years - $50K*
DFT-PRO 200 Series
DFT-PRO 201: 1 license for 3 years - $30K*
DFT-PRO 203: 3 licenses for 3 years - $45K*
DFT-PRO 210: 10 licenses for 3 years - $75K*
* Single payment
SynTest Technologies, Inc., est. 1990, develops and markets advanced Design-for-Test
(DFT) and Design-for-Debug/Diagnosis (DFD) tools throughout the world,
to semiconductor companies, system houses and design service providers.
The Company¯s products improve an electronic design's testability
and fault coverage and result in reduced defect levels and reduced slippage
in Time-to-Market (TTM). They also reduce overall design and test costs,
by helping to reduce design iterations as well as the time and reloads
on Automatic Test Equipment (ATE). These products include tools for logic
BIST, memory BIST, boundary-scan synthesis, DFT testability analysis,
VirtualScan synthesis and ATPG with XtremeCompact test vectors, concurrent
fault simulation, silicon debug and diagnosis. The Company headquartered
in Sunnyvale, California, has offices in China, Taiwan, Korea and Japan,
and distributors in Europe and Asia including Israel. More information
is available at www.syntest.com.
TurboBSD, TurboScan, VirtualScan, and XtremeCompact are trademarks of
SynTest Technologies, Inc. All other trademarks are property of their
ASIC: Application Specific Integrated Circuits
FPGA Field Programmable Gate Arrays
ATE: Automatic Test Equipment
IC: Integrated Circuits
ATPG: Automatic Test Program Generation
IDM: Integrated Device Manufacturer
BIST: Built-In Self-Test IP Intellectual Property
MNC: Multi-National Company
EDA: Electronic Design Automation
For more information:
SynTest contact info:
Nayan Pradhan, Senior Marketing Manager,
Tel:1- 408-720-9956 ext. 301, email@example.com