![]() SANYO
SELECTS SYNTEST FOR FAULT SIMULATION TurboFault's Speed And Capacity Are Key To Improving Circuit Quality and Time To Market LAS VEGAS (DESIGN AUTOMATION CONFERENCE) - June 18, 2001 - SynTest Technologies, Inc. (Sunnyvale, CA, USA), the leading supplier of DFT (Design-for-Test) tools and services for integrated circuit designers and foundries, today announced that Sanyo Semiconductor Company (NASDAQ: SANYY) has purchased SynTest's TurboFault - fault simulator for Sanyo's current and next generation System-on-Chip (SoC) designs. The 3-year contract is for multiple licenses of TurboFault. The value was not disclosed. Sanyo is using TurboFault
to fault-grade a large number of functional patterns at the whole chip
level to improve circuit quality and reduce time-to-market. Mr. Ohnishi, Manager of Sanyo Semiconductor Company noted, "TurboFault's processing time is shorter than other tools and we believe it is the only tool that provides fault coverage for multi-million gate LSI designs. It is also quite useful for generating high fault coverage test vectors in the earliest stage of the design." Mr. K. Yamamura, Senior Staff of Sanyo Semiconductor Company, commented "We are impressed not only by SynTest's technology but also by its support." TurboFault is a high-speed,
high-capacity, concurrent fault simulator for synchronous and asynchronous
gate-level designs. It handles multi-million gate designs with various
types of embedded memories. It is indispensable for achieving high fault
coverage. About Sanyo Electric
Co., Ltd. Semiconductor Company About SynTest TurboBIST-LOGIC, TurboBIST-Memory,
TurboBSD, TurboCheck, TurboFault, TurboFCE and TurboScan are trademarks
of SynTest Technologies, Inc. All other trademarks are the property of
their respective owners. |